TECHNOLOGY

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♦ MULTIPLE DIMENSION ILLUMINATION SYSTEM

Multiple dimension, multiple wavelength LED light provide multiple image combination, greatly enhance the contrast of defects’ capturing.

♦ INNOVATIVE IMAGE PROCESSING & DEFECT DETECTION ALGORITHM

The image algorithm has the capability to precisely detect the real defect without being affected by dust, contamination, and ITO print aberrations.

♦ RAPID DEFECT DENSITY ESTIMATION ALGORITHM

Significantly reduce 80% time consuming on calculation defect density. This is a robust defect density estimation algorithm which can detect the real defect with high density from fake defect, reduce false alert, enhance the system detection efficiency.